|
Princeton
University Invention # 09-2523
Quantum
Cascade (QC) wafer quality testing requires intensive processing and
characterization. Conventional techniques used for wafer quality testing include
photoluminescence, x-ray diffraction, Hall effect measurements, high resolution
x-ray diffraction, transmission electron microscopy and secondary...
Published: 3/30/2022
|
Inventor(s): Claire Gmachl, Ekua Bentil
Keywords(s):
Category(s): Mechanical/Electrical Engineering
|