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Rapid and Minimally Invasive Quantum Cascade Wafer Testing

Princeton University Invention # 09-2523 Quantum Cascade (QC) wafer quality testing requires intensive processing and characterization. Conventional techniques used for wafer quality testing include photoluminescence, x-ray diffraction, Hall effect measurements, high resolution x-ray diffraction, transmission electron microscopy and secondary...
Published: 11/29/2011   |   Inventor(s): Claire Gmachl, Ekua Bentil
Category(s): Mechanical/Electrical Engineering