Search Results - microelectronics

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Confocal Laser Induced fluorescence diagnostic with annular laser beam for large focal distances

Non-Confidential Brief Confocal Laser Induced Fluorescence Diagnostic With Annular Laser Beam for Large Focal Distances Princeton Docket # 23-4006-1 Laser induced fluorescence (LIF) is routinely used for characterization of plasma sources or in gas dynamic applications. Conventional LIF techniques require access to studied volume from two sides:...
Published: 8/20/2024   |   Inventor(s): Yevgeny Raitses, Ivan Romadanov
Keywords(s): microelectronics
Category(s): Mechanical/Electrical Engineering

Debris mitigation in laser produced plasmas using three-dimensional manipulation of magnetic topology

­Debris Mitigation in Laser Produced Plasmas Using Three-Dimensional Manipulation of Magnetic Topology Princeton Docket # 20-3704 Moore's law dictates that computer chips become ever smaller. The devices that fabricate these chips are facing constraints governed by fundamental physics. In order to achieve small chip size, the next generation...
Published: 8/20/2024   |   Inventor(s): Ahmed Diallo, Christopher Smiet, Ben Israeli, Marien Simeni Simeni
Keywords(s): microelectronics
Category(s): Materials, Quantum Computing and Electrical Engineering

A Novel Objective for EUV Microscopy and EUV Lithography

A Novel Objective for EUV Microscopy and EUV Lithography Princeton Docket # 14-2950 Researchers at Princeton Plasma Physics Laboratory (PPPL) have proposed a novel device for extreme ultraviolet (EUV) spectroscopy, EUV microscopy, and EUV lithography at wavelengths below 100 nm. Princeton is seeking an industry partner to develop and commercialize...
Published: 6/11/2024   |   Inventor(s): Manfred Bitter, Kenneth Hill, Philip Efthimion
Keywords(s): microelectronics
Category(s): Mechanical/Electrical Engineering, Computer Science and Information Technology