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Scanning Probe Lithography Using Non-Raster Trajectories Princeton Docket # 16-3186-1Researchers at Princeton University, PRISM Imaging and Analysis Center, have developed a new method for scanning probe lithography (SPL). This method has been developed with non-raster trajectories which can be synthesized by sine and cosine waveforms to drive the scanning process. Compared with the raster scan SPL, non-raster... Published: 4/24/2023   |   Inventor(s): Nan Yao, Wei Cai Keywords(s): microscopy Category(s): Mechanical/Electrical Engineering

Patterned Charge Generation Using Torsional Mode Atomic Force Microscopy Princeton Docket # 16-3203-1Researchers at Princeton University, PRISM Imaging and Analysis Center, have developed a new in-situ nano-triboelectrification method to generate patterned triboelectric charges on insulating material surface.This method has been developed using torsional resonance mode atomic force microscopy (AFM). It can significantly... Published: 2/14/2024   |   Inventor(s): Nan Yao, Wei Cai Keywords(s): microscopy Category(s): Mechanical/Electrical Engineering